Most people learn more from failures than from successes. In information technology management, many lessons have been learned over the years “the hard way” through failed implementations, poor management practices, technology limitations, and the like. Failure & Lessons Learned in Information Technology Management was devoted to addressing failures of and lessons learned from information technology projects in business, universities, government, and the military that did not succeed due to technology, management, organizational, social, cultural, and other issues. The goal was to learn from these cases and understand the basis of decisions made in order to not recreate the same mistakes or “reinvent the wheel.” The organizational names in the articles were protected by using pseudonyms.
Prof. Jay Liebowitz Robert W. Deutsch Distinguished Professor in IS Dept. of Information Systems University of Maryland-Baltimore County (UMBC) 1000 Hilltop Circle Baltimore, MD 21250
Dr. Bernt Bremdal, Bremdal Tech. Services, Norway Prof. Francisco Cantu-Ortiz, ITESM, Mexico Dr. Yi-Tzuu Chien, National Science Foundation, USA Dr. Myron Chin, Univ. of the West Indies, West Indies Prof. John Debenham, Univ. of Tech., Sydney, Australia Prof. Johan den Biggelaar, CIBIT, The Netherlands Roar Fjellheim, Computas Expert Syst. A.S., Norway Prof. Aleksandar Jovanovic, MPA Stuttgart, Germany Prof. Jae Kyu Lee, KAIST, Korea Prof. Mary Deutsch-McLeish, Univ. of Guelph, Canada Prof. Vladimir Milacic, Univ. of Belgrade, Yugoslavia Prof. Riichiro Mizoguchi, Osaka Univ., Japan Dr. Desai Narasimhalu, National Univ. of Singapore, Singapore Prof. Juan Pazos, Universidad Politecnica de Madrid, Spain Prof. Roy Rada, Washington State Univ., USA Prof. Ahmed Rafea, Center for Agricultural Expert Systems, Egypt Dr. Jose Ramirez, Paradigma C.A., Venezuela Prof. R. Sadananda, Asian Inst. of Tech., Thailand Prof. Alan Sangster, Queen’s Univ. of Belfast, United Kingdom Prof. Ching Suen, Concordia Univ., Canada Prof. I. Burhan Turksen, Univ of Toronto, Canada Dr. Gian P. Zarri, EHESS-CAMS, France Prof. Tu Xuyan, Beijing Univ. of Science & Tech., China